yield-analysis

A d3.js wafer map in a react component

Interactive wafer map visualization and yield analysis for semiconductor test data. Rendering, spatial statistics, failure clustering, lot-level trends, and reticle analysis — pure ES modules, no dependencies.

Have an LLM (LangGraph agent) control QuantLib, the cache, your databases and any plug-in tools. Includes evaluator framework and an Excel/LibreOffice API in https://github.com/FulgentMcGuffin/cqfi-xl and makes use of https://github.com/FulgentMcGuffin/mcp_data

📊 A Power BI project that analyzes agricultural productivity across Indian states using rainfall, fertilizer usage, pesticide application, and yield data. The interactive dashboard allows users to explore crop-wise and state-wise performance, identify key influencers, and derive actionable insights for improving agricultural outcomes.

Desktop and browser wafer map viewer for semiconductor test data — Tauri v2, Rust/WASM parsers for STDF/ATDF/CSV/JSON/Parquet, wafermap rendering

Municipal bond anomaly detector — flags small munis (<$20M) paying 50+ bps above peer average

Semiconductor equipment process monitoring and yield analysis portfolio using simulated CVD batch data.

Cambi Protocol's Cross-Collateral Yield Optimization Engine

Most associations in this public semiconductor dataset are artifacts of time. 32 features clear BH-FDR with permutation p=0.0005, but only 2 survive a change of time period. Chronological split, DuckDB/SQL warehouse, SPC, cost-aware baseline, every transform fitted on train only.

Physics-based Monte Carlo yield analysis and design optimisation tool for MZI optical switches in silicon photonics. Validated against published fab data.

Pro Tic Tac - Semiconductor Machine Learning & AI Analytics Showcase Platform

Wafer inspection and yield analytics for semiconductor fabs. Immutable measurement history, per-defect-code normalisation for lot/tool/step Pareto drill-down, CQRS over PostgreSQL. .NET 8, EF Core + Dapper, Redis, Prometheus.

Semantic risk layer for DeFi yield, powered by GenLayer consensus.

Automated root-cause analysis pipeline for semiconductor yield excursions using Random Forest classification.

Wafer defect pattern classification on WM-811K: engineered spatial features vs CNN, with explainability and automated excursion reporting

NAND validation analytics dashboard for yield review, firmware comparison, outlier detection, and release-readiness gating.

JMP-based lithography focus-dose process window and yield analysis using public exposure and inspection data.

BOM-aware defect correlation with automated root-cause ranking for semiconductor yield: SAP/Teamcenter BOM graphs, supplier lot ranking. scikit-learn · networkx · Snowflake · dbt. Root cause in 34 sec vs 2–3 days.

Yield Analytics

Semiconductor yield analysis platform built on UCI SECOM dataset (1567 lots × 590 sensors, ~924K rows in PostgreSQL)